Semiconductor Equipment
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ArF Scanners
(193nm wavelength)
Ultra-high optical and electromechanical precision for high volume production of chip layers.
KrF Scanners
(248nm wavelength)
IC production tools with technological advancements that support sub-wavelength techniques.
i-line Scanners
(365nm wavelength)
Cost effective solution for imaging less critical layers within an IC device.
ArF Scanners
(193nm wavelength)
Ultra-high optical and electromechanical precision, with predictive metrology for high volume production of chip layers.
FPA-7000AS7
FPA-7000AS5
FPA-7000AS7
FPA-7000AS5
KrF Scanners
(248nm wavelength)
Core tools of IC production with enhanced lens capabilities and corresponding mechanical advancements that support sub-wavelength techniques.
FPA-6000ES6a
FPA-5000ES4b
FPA-6000ES6a
FPA-5000ES4b
i-line Scanners
(365nm wavelength)
Cost effective solution for imaging less critical layers within an IC device.
FPA-5550iZ
FPA-5510iZ
FPA-5500iX
FPA-3000i5+
FPA-5550iZ
FPA-5510iZ
FPA-5500iX
FPA-3000i5+